Benchtop instruments for R&D laboratories and production sampling — defect mapping, PL/EL imaging, spectral analysis and 3D thickness measurement. Content from www.tdm-tek.com/products/offline.
Defect mapping for thin-film surfaces.
EL/PL imaging with defect mapping.
Integrated EPL, AOI and degradation.
Hyperspectral EL/PL mapping.
High-resolution AOI + EPL integrated.
Portable photoluminescence metrology.
Multi-function spectral thin-film tool.
Microscopic thickness measurement.
3D optical profiling.
Profiler with scan stage.
Imaging 3D thickness measuring instrument.