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Inline Production Line Measurement

Production-line measurement systems for in-process thickness and optical metrology — sampling perovskite and multi-layer films at full line speed with no sample preparation, built for closed-loop process control. Content from www.tdm-tek.com/products/inline.

Thickness & UniformityTransmittanceReflectanceEL/PL MappingSingle Point PLAOILABRoughnessGlass WarpageColor DifferenceSheet Resistance

Metrology Solutions for Perovskite Full-Stack Films 2 models

TDM-TEKTECHCESS®
SE600X

Inline Perovskite Thickness, PL and T&R

Inline perovskite thickness, PL and transmittance/reflectance.

TDM-TEKTECHCESS®
SE200x

Inline PL Mapping and AOI Defect Inspection

Inline PL mapping with AOI defect inspection.

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