Thin Film Metrology, PV Reliability & Inkjet Printing Equipment

Compare five equipment series by measurement stage: offline laboratory metrology, inline production measurement, in-situ coating monitoring, PV reliability testing, and inkjet printing tools. Content from TDM Product Portfolio — styled for Techcess.

Offline Inline In-situ Reliability Inkjet

OfflineLab R&D, sampling & mapping

InlineProduction-line optical metrology

In-situWet-film & optical monitoring

ReliabilityI–V, MPPT, light degradation

InkjetProcess development tools

Series 01

Offline Thin Film Measurement

Benchtop laboratory metrology for R&D and sampling.

11 products View series detail

TDM-TEKTECHCESS®

SE10

Portable PL Metrology Instrument

Spectra solution · portable PL.

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TDM-TEKTECHCESS®

SE20

Defect Mapping Instrument

Machine vision · defect mapping.

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TDM-TEKTECHCESS®

SE60

EL/PL & Defect Mapping

Machine vision · EL/PL integrated.

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Series 02

Inline Production Line Measurement

In-line metrology for perovskite full-stack films.

2 products View series detail

TDM-TEKTECHCESS®

SE600X

Inline Perovskite Metrology

Full-stack inline optical & film metrology.

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TDM-TEKTECHCESS®

SE200x

Inline PL Mapping & AOI

PL mapping and AOI defect inspection.

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Series 03

In-situ Real-time Monitoring

SE31 and SE310 monitor film thickness and reflectance from the coating head. SE31-FM provides a separate wide-band transmission/reflection route; specifications are model-specific.

4 products View series detail

TDM-TEKTECHCESS®